MEMUNITY is an open community of members from the MEMS manufacturing industry, research and academia. The goal of MEMUNITY is the development and promotion of wafer-level test techniques and equipment that enable the direct application of non-electrical input to each individual die, as well as the measurement of non-electrical output. Examples of such stimuli include light, pressure, motion, acceleration, temperature and sound.

As a guest on our website, you will find general information about our community, wafer-level MEMS testing and test solutions, as well as about the PAR-TEST project. Further, more detailed information is available to everyone who applies for a free membership.

Click here to find out about the MEMUNITY Workshops for 2010!