MEMUNITY is an open community of members from the MEMS manufacturing industry, research and academia. The goal of MEMUNITY is the development and promotion of wafer-level test techniques and equipment that enable the direct application of non-electrical input to each individual die, as well as the measurement of non-electrical output. Examples of such stimuli include light, pressure, motion, acceleration, temperature and sound.

As a guest on our website, you will find general information about our community, wafer-level MEMS testing and test solutions, as well as about the PAR-TEST project. Further, more detailed information is available to everyone who applies for a free membership.

+++ Successful 8th MEMUNITY Workshop +++

On 13 March 2008, the 8th MEMUNITY Workshop took place at IMMS in Ilmenau, Germany. The workshop, Critical Success Factors for Commercialization - Production Test of MEMS at Wafer-Level, attracted over 50 attendees from several European countries.

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